Near-field differential scanning optical microscope with atomic force regulation

R. Toledo-Crow; P. C. Yang; Y. Chen; M. Vaez-Iravani

doi:10.1063/1.106801

Near-field differential scanning optical microscope with atomic force regulation

R. Toledo-Crow, P. C. Yang, Y. Chen, M. Vaez-Iravani

Producción científica: Article › revisión exhaustiva

445 Citas (Scopus)

Resumen

We present the design and describe the operation of a scanning probe microscope which simultaneously provides the attractive mode force and near-field optical images of objects. In this technique, the force signal is used to track the topography, thus allowing the optical signal primarily to show variations in transmissivity. A number of results are presented on the application of the technique to imaging different samples.

Idioma original	English (US)
Páginas (desde-hasta)	2957-2959
Número de páginas	3
Publicación	Applied Physics Letters
Volumen	60
N.º	24
DOI	https://doi.org/10.1063/1.106801
Estado	Published - 1992
Publicado de forma externa	Sí

ASJC Scopus subject areas

Physics and Astronomy (miscellaneous)

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abstract = "We present the design and describe the operation of a scanning probe microscope which simultaneously provides the attractive mode force and near-field optical images of objects. In this technique, the force signal is used to track the topography, thus allowing the optical signal primarily to show variations in transmissivity. A number of results are presented on the application of the technique to imaging different samples.",

author = "R. Toledo-Crow and Yang, {P. C.} and Y. Chen and M. Vaez-Iravani",

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AB - We present the design and describe the operation of a scanning probe microscope which simultaneously provides the attractive mode force and near-field optical images of objects. In this technique, the force signal is used to track the topography, thus allowing the optical signal primarily to show variations in transmissivity. A number of results are presented on the application of the technique to imaging different samples.

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Near-field differential scanning optical microscope with atomic force regulation

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