Near-field differential scanning optical microscope with atomic force regulation

R. Toledo-Crow, P. C. Yang, Y. Chen, M. Vaez-Iravani

Producción científica: Articlerevisión exhaustiva

444 Citas (Scopus)

Resumen

We present the design and describe the operation of a scanning probe microscope which simultaneously provides the attractive mode force and near-field optical images of objects. In this technique, the force signal is used to track the topography, thus allowing the optical signal primarily to show variations in transmissivity. A number of results are presented on the application of the technique to imaging different samples.

Idioma originalEnglish (US)
Páginas (desde-hasta)2957-2959
Número de páginas3
PublicaciónApplied Physics Letters
Volumen60
N.º24
DOI
EstadoPublished - 1992
Publicado de forma externa

ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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