Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))

L. C. Barrio; T. Suchyna; T. Bargiello; Xian Xu Lie Xian Xu; R. S. Roginski; M. V.L. Bennett; B. J. Nicholson

doi:10.1073/pnas.89.9.4220-b

Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))

L. C. Barrio
, T. Suchyna
, T. Bargiello
, Xian Xu Lie Xian Xu
, R. S. Roginski
, M. V.L. Bennett
, B. J. Nicholson

Producción científica: Comment/debate › revisión exhaustiva

Idioma original	English (US)
Páginas (desde-hasta)	4220
Número de páginas	1
Publicación	Proceedings of the National Academy of Sciences of the United States of America
Volumen	89
N.º	9
DOI	https://doi.org/10.1073/pnas.89.9.4220-b
Estado	Published - 1992
Publicado de forma externa	Sí

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Barrio, L. C., Suchyna, T., Bargiello, T., Lie Xian Xu, X. X., Roginski, R. S., Bennett, M. V. L., & Nicholson, B. J. (1992). Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414)). Proceedings of the National Academy of Sciences of the United States of America, 89(9), 4220. https://doi.org/10.1073/pnas.89.9.4220-b

Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414)). / Barrio, L. C.; Suchyna, T.; Bargiello, T. et al.
En: Proceedings of the National Academy of Sciences of the United States of America, Vol. 89, N.º 9, 1992, p. 4220.

Producción científica: Comment/debate › revisión exhaustiva

Barrio, LC, Suchyna, T, Bargiello, T, Lie Xian Xu, XX, Roginski, RS, Bennett, MVL & Nicholson, BJ 1992, 'Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414))', Proceedings of the National Academy of Sciences of the United States of America, vol. 89, n.º 9, pp. 4220. https://doi.org/10.1073/pnas.89.9.4220-b

Barrio LC, Suchyna T, Bargiello T, Lie Xian Xu XX, Roginski RS, Bennett MVL et al. Erratum: Gap junctions formed by connexins 26 and 32 alone and in combination are differently affected by applied voltage (Proc. Natl. Acad. Sci. USA (October 1, 1991) 88 (8410-8414)). Proceedings of the National Academy of Sciences of the United States of America. 1992;89(9):4220. doi: 10.1073/pnas.89.9.4220-b

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