Probe beam deflection optical imaging of thermal and mechanical phenomena resulting from nanosecond electric pulse (nsEP) exposure in-vitro

Ronald A. Barnes, Caleb C. Roth, Hope T. Beier, Gary Noojin, Christopher Valdez, Joel Bixler, Erick Moen, Mehdi Shadaram, Bennett L. Ibey

Research output: Contribution to journalArticlepeer-review

7 Scopus citations

Abstract

Electric-field induced physical phenomena, such as thermal, mechanical and electrochemical dynamics, may be the driving mechanism behind bioeffects observed in mammalian cells during exposure to nanosecond-duration electric pulses (nsEP) in-vitro. Correlating a driving mechanism to a biological response requires the experimental measurement and quantification of all physical dynamics resulting from the nsEP stimulus. A passive and electromagnetic interference (EMI) immune sensor is required to resolve these dynamics in high strength electric fields. The probe beam deflection technique (PBDT) is a passive and EMI immune optical method for quantifying and imaging refractive index gradients in liquids and gases, both dynamic and static, with nanosecond temporal resolution. In this work, a probe beam deflection imaging system was designed to acquire 2-D time-lapse images of thermal/mechanical dynamics resulting from monopolar and bipolar nsEP stimulus.

Original languageEnglish (US)
Pages (from-to)6621-6643
Number of pages23
JournalOptics Express
Volume25
Issue number6
DOIs
StatePublished - Mar 20 2017
Externally publishedYes

ASJC Scopus subject areas

  • Atomic and Molecular Physics, and Optics

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