Abstract
We present the design and describe the operation of a scanning probe microscope which simultaneously provides the attractive mode force and near-field optical images of objects. In this technique, the force signal is used to track the topography, thus allowing the optical signal primarily to show variations in transmissivity. A number of results are presented on the application of the technique to imaging different samples.
Original language | English (US) |
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Pages (from-to) | 2957-2959 |
Number of pages | 3 |
Journal | Applied Physics Letters |
Volume | 60 |
Issue number | 24 |
DOIs | |
State | Published - 1992 |
Externally published | Yes |
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)