Near-field differential scanning optical microscope with atomic force regulation

R. Toledo-Crow, P. C. Yang, Y. Chen, M. Vaez-Iravani

Research output: Contribution to journalArticle

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Abstract

We present the design and describe the operation of a scanning probe microscope which simultaneously provides the attractive mode force and near-field optical images of objects. In this technique, the force signal is used to track the topography, thus allowing the optical signal primarily to show variations in transmissivity. A number of results are presented on the application of the technique to imaging different samples.

Original languageEnglish (US)
Pages (from-to)2957-2959
Number of pages3
JournalApplied Physics Letters
Volume60
Issue number24
DOIs
StatePublished - Dec 1 1992
Externally publishedYes

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ASJC Scopus subject areas

  • Physics and Astronomy (miscellaneous)

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