Determination of Reliability Functions by the TTT Transform

Ramesh C. Gupta, Joel E. Michalek

Research output: Contribution to journalArticle

5 Scopus citations

Abstract

Given the total time on test transform, an explicit method is developed to determine the survival function, the mean residual life function and related functions. An example is provided to illustrate the technique.

Original languageEnglish (US)
Pages (from-to)175-176
Number of pages2
JournalIEEE Transactions on Reliability
VolumeR-34
Issue number2
DOIs
StatePublished - Jun 1985

Keywords

  • Failure rate
  • Mean residual life function
  • Total time on test transform

ASJC Scopus subject areas

  • Safety, Risk, Reliability and Quality
  • Electrical and Electronic Engineering

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