Abstract
Given the total time on test transform, an explicit method is developed to determine the survival function, the mean residual life function and related functions. An example is provided to illustrate the technique.
Original language | English (US) |
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Pages (from-to) | 175-176 |
Number of pages | 2 |
Journal | IEEE Transactions on Reliability |
Volume | R-34 |
Issue number | 2 |
DOIs | |
State | Published - Jun 1985 |
Keywords
- Failure rate
- Mean residual life function
- Total time on test transform
ASJC Scopus subject areas
- Safety, Risk, Reliability and Quality
- Electrical and Electronic Engineering