Detecting localized interspersed motifs in genomic sequences

Victor Jin, Marcel Turcotte

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Abstract

Repeated sequences account for a significant fraction of Eukaryotic genomes - nearly half of the human genome consists of repeated sequence elements. Several elements have been linked to diseases. Consequently, identifying and characterizing repeated elements is essential for understanding diseases at the molecular level. Repeated sequences vary from one genome to another and are therefore difficult to identify using sequence comparison methods alone. Certain gene families, such as the interferon gene family or the natural killer gene complex, have been found to be clustered together in the genome. Several observations have lead to the hypothesis that specific sequence repeats could be playing an important role in generating multigene families. Here, we define the concept of localized interspersed motifs and present a computational approach for detecting them.

Original languageEnglish (US)
Title of host publicationIMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference
Pages267-270
Number of pages4
DOIs
Publication statusPublished - Dec 1 2005
EventIMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference - Ottawa, ON, Canada
Duration: May 16 2005May 19 2005

Publication series

NameConference Record - IEEE Instrumentation and Measurement Technology Conference
Volume1
ISSN (Print)1091-5281

Other

OtherIMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference
CountryCanada
CityOttawa, ON
Period5/16/055/19/05

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Keywords

  • Clustering
  • DNA
  • Molecular sequence analysis
  • Repetitive elements

ASJC Scopus subject areas

  • Electrical and Electronic Engineering

Cite this

Jin, V., & Turcotte, M. (2005). Detecting localized interspersed motifs in genomic sequences. In IMTC'05 - Proceedings of the IEEE Instrumentation and Measurement Technology Conference (pp. 267-270). [1604114] (Conference Record - IEEE Instrumentation and Measurement Technology Conference; Vol. 1). https://doi.org/10.1109/IMTC.2004.1351042