Breakdown limits on gigavolt-per-meter electron-beam-driven wakefields in dielectric structures

M. C. Thompson; H. Badakov; A. M. Cook; J. B. Rosenzweig; R. Tikhoplav; G. Travish; I. Blumenfeld; M. J. Hogan; R. Ischebeck; N. Kirby; R. Siemann; D. Walz; P. Muggli; A. Scott; R. B. Yoder

doi:10.1103/PhysRevLett.100.214801

Breakdown limits on gigavolt-per-meter electron-beam-driven wakefields in dielectric structures

M. C. Thompson
, H. Badakov
, A. M. Cook
, J. B. Rosenzweig
, R. Tikhoplav
, G. Travish
, I. Blumenfeld
, M. J. Hogan
, R. Ischebeck
, N. Kirby
, R. Siemann
, D. Walz
, P. Muggli
, A. Scott
, R. B. Yoder

Research output: Contribution to journal › Article › peer-review

177 Scopus citations

Abstract

First measurements of the breakdown threshold in a dielectric subjected to GV/m wakefields produced by short (30-330fs), 28.5GeV electron bunches have been made. Fused silica tubes of 100μm inner diameter were exposed to a range of bunch lengths, allowing surface dielectric fields up to 27GV/m to be generated. The onset of breakdown, detected through light emission from the tube ends, is observed to occur when the peak electric field at the dielectric surface reaches 13.8±0.7GV/m. The correlation of structure damage to beam-induced breakdown is established using an array of postexposure inspection techniques.

Original language	English (US)
Article number	214801
Journal	Physical Review Letters
Volume	100
Issue number	21
DOIs	https://doi.org/10.1103/PhysRevLett.100.214801
State	Published - May 27 2008
Externally published	Yes

ASJC Scopus subject areas

General Physics and Astronomy

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10.1103/PhysRevLett.100.214801

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Thompson, M. C., Badakov, H., Cook, A. M., Rosenzweig, J. B., Tikhoplav, R., Travish, G., Blumenfeld, I., Hogan, M. J., Ischebeck, R., Kirby, N., Siemann, R., Walz, D., Muggli, P., Scott, A., & Yoder, R. B. (2008). Breakdown limits on gigavolt-per-meter electron-beam-driven wakefields in dielectric structures. Physical Review Letters, 100(21), Article 214801. https://doi.org/10.1103/PhysRevLett.100.214801

Thompson, MC, Badakov, H, Cook, AM, Rosenzweig, JB, Tikhoplav, R, Travish, G, Blumenfeld, I, Hogan, MJ, Ischebeck, R, Kirby, N, Siemann, R, Walz, D, Muggli, P, Scott, A & Yoder, RB 2008, 'Breakdown limits on gigavolt-per-meter electron-beam-driven wakefields in dielectric structures', Physical Review Letters, vol. 100, no. 21, 214801. https://doi.org/10.1103/PhysRevLett.100.214801

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abstract = "First measurements of the breakdown threshold in a dielectric subjected to GV/m wakefields produced by short (30-330fs), 28.5GeV electron bunches have been made. Fused silica tubes of 100μm inner diameter were exposed to a range of bunch lengths, allowing surface dielectric fields up to 27GV/m to be generated. The onset of breakdown, detected through light emission from the tube ends, is observed to occur when the peak electric field at the dielectric surface reaches 13.8±0.7GV/m. The correlation of structure damage to beam-induced breakdown is established using an array of postexposure inspection techniques.",

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year = "2008",

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doi = "10.1103/PhysRevLett.100.214801",

language = "English (US)",

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AU - Thompson, M. C.

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AU - Cook, A. M.

AU - Rosenzweig, J. B.

AU - Tikhoplav, R.

AU - Travish, G.

AU - Blumenfeld, I.

AU - Hogan, M. J.

AU - Ischebeck, R.

AU - Kirby, N.

AU - Siemann, R.

AU - Walz, D.

AU - Muggli, P.

AU - Scott, A.

AU - Yoder, R. B.

PY - 2008/5/27

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N2 - First measurements of the breakdown threshold in a dielectric subjected to GV/m wakefields produced by short (30-330fs), 28.5GeV electron bunches have been made. Fused silica tubes of 100μm inner diameter were exposed to a range of bunch lengths, allowing surface dielectric fields up to 27GV/m to be generated. The onset of breakdown, detected through light emission from the tube ends, is observed to occur when the peak electric field at the dielectric surface reaches 13.8±0.7GV/m. The correlation of structure damage to beam-induced breakdown is established using an array of postexposure inspection techniques.

AB - First measurements of the breakdown threshold in a dielectric subjected to GV/m wakefields produced by short (30-330fs), 28.5GeV electron bunches have been made. Fused silica tubes of 100μm inner diameter were exposed to a range of bunch lengths, allowing surface dielectric fields up to 27GV/m to be generated. The onset of breakdown, detected through light emission from the tube ends, is observed to occur when the peak electric field at the dielectric surface reaches 13.8±0.7GV/m. The correlation of structure damage to beam-induced breakdown is established using an array of postexposure inspection techniques.

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Breakdown limits on gigavolt-per-meter electron-beam-driven wakefields in dielectric structures

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