Breakdown limits on gigavolt-per-meter electron-beam-driven wakefields in dielectric structures

M. C. Thompson, H. Badakov, A. M. Cook, J. B. Rosenzweig, R. Tikhoplav, G. Travish, I. Blumenfeld, M. J. Hogan, R. Ischebeck, N. Kirby, R. Siemann, D. Walz, P. Muggli, A. Scott, R. B. Yoder

Research output: Contribution to journalArticlepeer-review

144 Scopus citations

Abstract

First measurements of the breakdown threshold in a dielectric subjected to GV/m wakefields produced by short (30-330fs), 28.5GeV electron bunches have been made. Fused silica tubes of 100μm inner diameter were exposed to a range of bunch lengths, allowing surface dielectric fields up to 27GV/m to be generated. The onset of breakdown, detected through light emission from the tube ends, is observed to occur when the peak electric field at the dielectric surface reaches 13.8±0.7GV/m. The correlation of structure damage to beam-induced breakdown is established using an array of postexposure inspection techniques.

Original languageEnglish (US)
Article number214801
JournalPhysical Review Letters
Volume100
Issue number21
DOIs
StatePublished - May 27 2008
Externally publishedYes

ASJC Scopus subject areas

  • Physics and Astronomy(all)

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