A matrix to correct for K-edge escape and Compton scatter in X- and gamma -ray detectors

R. G. Waggener, W. D. McDavid, L. B. Levy, P. Zanca

Research output: Contribution to journalArticlepeer-review

Abstract

The fraction of X- and gamma -ray photons that give rise to a K-edge escape photon of iodine as a function of photon energy is derived for a NaI(Tl) detector from published values in the literature and confirmed by experimental measurement for a 2*2 inch detector. These values are used to derive a matrix describing the K-edge escape of iodine for NaI(Tl) photon detectors. The fraction of Compton photons scattered into each lower energy channel as a function of incident photon energy is measured utilizing monoenergetic photon sources. From these measured values, a matrix is derived that described the effects of Compton scatter in the crystal as a function of incident photon energy. The matrix Ekj(E), describing K-edge escape photons, and the matrix, Skj(E), describing Compton scatter, are combined to form the matrix Ckj(E), describing both escape and Compton scattered photons.

Original languageEnglish (US)
Article number014
Pages (from-to)585-586
Number of pages2
JournalPhysics in Medicine and Biology
Volume18
Issue number4
DOIs
StatePublished - Dec 1 1973

ASJC Scopus subject areas

  • Radiological and Ultrasound Technology
  • Radiology Nuclear Medicine and imaging

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